Puglisi, F.M. and Pavan, P. 2014. Factorial Hidden Markov Model analysis of Random Telegraph Noise in Resistive Random Access Memories. ECTI Transactions on Electrical Engineering, Electronics, and Communications. 12, 1 (Jan. 2014), 24–29. DOI:https://doi.org/10.37936/ecti-eec.2014121.170814.