H. M., V. and Ramakrishnan, V.N. 2022. Geometrical Variation of a Conductive Filament in RRAM and Its Impact on a Single-Event Upset. ECTI Transactions on Electrical Engineering, Electronics, and Communications. 20, 1 (Feb. 2022), 32–38. DOI:https://doi.org/10.37936/ecti-eec.2022201.246101.