San-Um, W., & Masayoshi, T. (2009). An On-Chip Analog Mixed-Signal Testing Compliant with IEEE 1149.4 Standard Using Fault Signature Characterization Technique. ECTI Transactions on Electrical Engineering, Electronics, and Communications, 8(1), 85–92. https://doi.org/10.37936/ecti-eec.201081.172036