PRADHAN, K. P.; MOHAPATRA, S. K.; SAHU, P. K.; PARIJA, S. Impact of Strain on Fully Depleted Strained Gate Stack Double Gate MOSFET: A Simulation Study. ECTI Transactions on Electrical Engineering, Electronics, and Communications, [S. l.], v. 13, n. 2, p. 54–57, 2015. DOI: 10.37936/ecti-eec.2015132.171029. Disponível em: https://ph02.tci-thaijo.org/index.php/ECTI-EEC/article/view/171029. Acesso em: 13 apr. 2025.