SAN-UM, W.; MASAYOSHI, T. A Low-Cost High-Speed Pulse Response Based Built-In Self Test For Analog Integrated Circuits. ECTI Transactions on Electrical Engineering, Electronics, and Communications, [S. l.], v. 8, n. 2, p. 197–208, 2009. DOI: 10.37936/ecti-eec.201082.172098. Disponível em: https://ph02.tci-thaijo.org/index.php/ECTI-EEC/article/view/172098. Acesso em: 6 apr. 2025.