Pradhan, K. P., S. K. Mohapatra, P. K Sahu, and S. Parija. “Impact of Strain on Fully Depleted Strained Gate Stack Double Gate MOSFET: A Simulation Study”. ECTI Transactions on Electrical Engineering, Electronics, and Communications 13, no. 2 (June 6, 2015): 54–57. accessed August 28, 2026. https://ph02.tci-thaijo.org/index.php/ECTI-EEC/article/view/171029.