Kanarkard, Wanida, Danaipong Chetchotsak, Daranee Hormdee, Rod Adams, and Neil Davey. “Data Mining to Recognize Fail Parts in Manufacturing Process”. ECTI Transactions on Electrical Engineering, Electronics, and Communications 7, no. 2 (May 27, 2008): 33–38. accessed September 18, 2026. https://ph02.tci-thaijo.org/index.php/ECTI-EEC/article/view/171876.