H. M., Vijay, and V. N. Ramakrishnan. “Geometrical Variation of a Conductive Filament in RRAM and Its Impact on a Single-Event Upset”. ECTI Transactions on Electrical Engineering, Electronics, and Communications 20, no. 1 (February 18, 2022): 32–38. Accessed April 28, 2024. https://ph02.tci-thaijo.org/index.php/ECTI-EEC/article/view/246101.