On Generalized ISI Index of the Crystallographic Structure of Tin Dioxide

Abstract

Topological indices are molecular descriptors that help in understanding the physical, chemical and biological properties of molecular structures. The generalization of the Inverse Sum Indeg (ISI) index can be used to obtain many standard degree-based topological indices. In this paper, we have computed the generalized ISI index and its associated topological indices for the crystallographic structure of Tin dioxide, SnO₂. These indices are expressed in terms of three variables (l,m,n) such that each corresponds to a particular direction in the growth of the SnO₂ crystal. The variation of the topological indices with respect to the three parameters is also studied graphically.