KATEMUKDA, N. Applying the logistic regression for the quality of microelectronics product. Journal of Applied Statistics and Information Technology, [S. l.], v. 6, n. 2, p. 25–35, 2021. Disponível em: https://ph02.tci-thaijo.org/index.php/asit-journal/article/view/244267. Acesso em: 29 aug. 2026.