PHUAKSAMAN, C. Reducing Electrical-Test Cycle Time for Electronic Component. NKRAFA JOURNAL OF SCIENCE AND TECHNOLOGY, [S. l.], v. 22, n. 1, p. 36–47, 2026. Disponível em: https://ph02.tci-thaijo.org/index.php/nkrafa-sct/article/view/259868. Acesso em: 16 sep. 2026.