Analytical and Experimental Investigation of Substrate Permittivity and Loss up to 67 GHz

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Published: Feb 17, 2015
DOI: https://doi.org/10.37936/ecti-eec.2015131.170977
Keywords:
Permittivity measurement dielectric properties planar transmission lines TRL higher order modes

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Patrick Seiler
Communications Lab and Chair for RF Engineering at the Cluster of Excellence 'Center for Advancing Electronics Dresden', Technische Universität Dresden
Bernhard Klein
Communications Lab and Chair for RF Engineering at the Cluster of Excellence 'Center for Advancing Electronics Dresden', Technische Universität Dresden
Dirk Plettemeier
Communications Lab and Chair for RF Engineering at the Cluster of Excellence 'Center for Advancing Electronics Dresden', Technische Universität Dresden

Abstract

In this paper, we characterize the substrate permittivity and overall loss of different planar transmission lines (TL) such as microstrip (MS), coplanar waveguide (CPW) and grounded CPW (GCPW) using on-wafer probes and a thru-reflect-line (TRL) calibration technique. The theory for calculation of the related effective permittivity from S-Parameter measurements is given and numerical simulations are being used for a fast and precise mapping of the effective permittivity to the physical value of the TL's substrate. The method presented can be used for higher frequencies, as long as single mode operation of the TLs is ensured. Thus, an overview on higher order modes in TLs and design rules to suppress them is given. The results up to 67 GHz for the aforementioned TL on a conventional RF substrate are presented and used to evaluate approximate models known from publications.

Article Details

How to Cite
Seiler, P., Klein, B., & Plettemeier, D. (2015). Analytical and Experimental Investigation of Substrate Permittivity and Loss up to 67 GHz. ECTI Transactions on Electrical Engineering, Electronics, and Communications, 13(1), 26–34. https://doi.org/10.37936/ecti-eec.2015131.170977
Issue
Vol. 13 No. 1 (2015): Regular Issue
Section
Circuits and Systems

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