An On-Chip Analog Mixed-Signal Testing Compliant with IEEE 1149.4 Standard Using Fault Signature Characterization Technique
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Abstract
An on-chip analog mixed-signal testing, compliant with IEEE 1149.4 standard is presented. The testing technique is based on sinusoidal output response characterizations, yielding a complete detection of AC and DC fault signatures without a need for simulation-before-test process. The testing system is an extension of IEEE 1149.4 standard, and affords functionalities for both pre-screening on-chip and high-quality o®-chip testing. A 4th-order low pass Gm-C ¯lter was employed as a circuit-under-test, and implemented with the proposed testing approach in a physical level using 0.18-m CMOS technology, and simulated using Hspice. The maximum operating frequency of the testing circuit is 260MHz. Both catastrophic and parametric faults are potentially detectable with low performance degradation. The fault coverage of faults associated in CMOS and capacitors are relatively high at 94% and 100%, respectively.
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