The Measurement System for Particle Size on Surface of Hard Disk Drive based on Experimental Light Scattering of BRDF Simulation

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Mongkol Wannaprapa
Narongpun Rungcharoen
Wanchai Pijitrojana

Abstract

This work aims to obtain the perfectly measurement system for 200-600 nanometer of particle size, type of SiO2 on surface of Lubricant (n20D ) recording media of hard disk drive, at 448 and 635 nm of incident wavelength. This system uses an incident and reflective angles equally, 89o, based on the principle of Mie scattering theory. Moreover, the system is applied to compare an intensity value of scattered light between of BRDFpart simulation model and of experiment result of David W. Hahn light scattering. For the conclusion, this system could measure the particle sizes and types accurately and efficiently.

Article Details

How to Cite
Wannaprapa, M., Rungcharoen, N., & Pijitrojana, W. (2010). The Measurement System for Particle Size on Surface of Hard Disk Drive based on Experimental Light Scattering of BRDF Simulation. ECTI Transactions on Electrical Engineering, Electronics, and Communications, 9(2), 284–291. https://doi.org/10.37936/ecti-eec.201192.172506
Section
Research Article

References

[1] R. Xu, "Particle characterization light scattering methods," in KLUWER ACADEMIC PUBLISHERS, ISBN: 0-792-36300-0, (2002).

[2] http://books.google.com/books?id=GpAO5dGXN60C&pg=PA125&lpg=PA125&dq=lubricant+refractive+index&source.

[3] P. A. Webb, "A primer on particle sizing by static laser light scattering," Micromeritics technical workshop series (2000).

[4] T. A. Germer, "Angular dependence and polarization of out-of-plane optical scattering from particulate contamination subsurface defects and surface micro roughness," SPIE 3275, 8798-8805, (1997).

[5] D. W. Hahn, "Light Scattering Theory," Department of Mechnical and Aerospace Engineering (2008).

[6] Y.Mori, H.An, K.Endo, K.Yamauchi and T.Ied "A new apparatus for measuring particle sizes of the order of nanometer," J.JSPE, Sept 1991.

[7] S.SASAKI, H.AN, Y.MORI, T.KATAOKA, K.ENDO "Evaluation of particle on a Si wafer before and after cleaning using a new laser particle counter," IEEE, 317-320, 26-28 Sept.

[8] http://hyperphysics.phyastr.edu/hbase/atmos/blusky.html.28-Feb-2006.

[9] http://commons.wikimedia.org/wiki/Image:Miescattering. svg.

[10] C. Wym "An introduction to BRDF-based lighting", NVIDIA Corporation.

[11] Thomas A. Germer "Modeled integrated scatter tool (MIST)", Available free of charge from NIST: http://physics.nist.gov/scatmech (2006).