Frequency Response Characterization of Microwave Photonics Components

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Ukrit Mankong


This paper reviews the research activities in Microwave Photonic component frequency characterization at Department of Electrical Engineering, Chiang Mai University. Optical detector frequency response calibration is based on a two-tone technique where the two-tone stimulus light is generated by a Mach Zehnder Modulator. We present a calibration system where standard Mach Zehnder Modulator is used instead of a high extinction ratio one. The two-tone light power is also controlled by an optical amplifier. Once the photodiode is calibrated, it can be used to measure frequency characteristics of other components such as directly modulated lasers.

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Research Articles


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T. Tangmala, S. Potha, U. Mankong, K. Inagaki and T. Kawanishi, “Optoelectronic Frequency Response Measurement Using Standard Mach-Zehnder Modulator,” in The 11th International Conference on Optical Communications and Networks (ICOCN2012), Pattaya, Thailand, 28-30 November, 2012.

Keizo Inagaki, Ukrit Mankong, and T. Kawanishi, "Uncertainity Estimation on Optoelectronic Frequency Response Measurement of Photodiodes Using Mach-Zehnder Modulator," in Asia-Pacific Microwave Photonics Conference 2012 (APMP 2012), Kyoto, Japan, 25-27 April, 2012.

U. Mankong, T. Tangmala, K. Inagaki and T. Kawanishi, “Bandwidth Enhancement by Optical Amplifier for the Optoelectronic Frequency Response Calibration Technique using Mach Zehnder Modulator,” in Asia-Pacific Microwave Photonics Conference 2012 (APMP 2012), Kyoto, Japan, 25-27 April, 2012.

T. Tangmala, U. Mankong, K. Inagaki, and T. Kawanishi, " PD Frequency Response Measurement Technique Using MZM with Two-tone Lightwave Power Control" in the 10th Conference on Lasers and Electro-Optics Pacific Rim (CLEO-PR 2013), Kyoto, Japan, June 30 - July 4, 2013