Optimization of Suitable Formvar Film Thickness Using AFM to Support Ultrathin Specimen for TEM

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Published: Jun 30, 2020
DOI: https://doi.org/10.14456/microsc-microanal-res.2020.5
Keywords:
formvar film; atomic force microscopy; preparation

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Piyanan Thanomchat
Scientific Equipment and Research Division, Kasetsart University Research and Development Institute, Kasetsart University, Bangkok, 10900, Thailand

Abstract

Formvar is a polyvinyl formaldehyde polymer used to support specimen for transmission electron microscopic (TEM) study. It is appropriate as a film supporting because it has a resistant to electron beam. In this study, formvar films were prepared by casting with 0.20 0.25 0.30 percent formvar solutions for 3 5 8 and 10 seconds on glass slides. The thicknesses of film were observed using an atomic force microscope (AFM). The result showed that the film thickness varied upon the formvar concentrations and the casting times. The suitable film thicknesses were obtained from 0.20 percent solution with 10 seconds, 0.25 percent with 5-10 seconds and 0.30 percent with 3-8 seconds casting times. Overall of this study, it was found that the film thicknesses between 32.14±1.89-56.39±5.30 nanometers are suitable to support the specimens for TEM.

Article Details

How to Cite
(1)
Thanomchat, P. Optimization of Suitable Formvar Film Thickness Using AFM to Support Ultrathin Specimen for TEM. Microsc. Microanal. Res. 2020, 33, 18-21.
Issue
Vol. 33 No. 1 (2020): Microsc. Microanal. Res.
Section
The 37th International Conference on The Microscopy Society of Thailand

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